Dear colleagues,

On behalf of the local organizing committee it is pleasure for me to thank all the participants of the International Conference “Scanning Probe Microscopy 2017” (SPM-2017)!

SPM-2017 welcomed about 150 participants from 8 countries and 24 cities of Russia.

The conference witnessed 9 industrial, 14 invited, 44 oral, and 104 poster presentations. The proceedings will be published as the special issues of IOP Conference Series: Materials Science and Engineering and FERROELECTRICS journals.

Organizing committee acknowledges sponsors and exhibitors: Taylor & Francis, Russian Foundation for Basic Research, NT-MDT Spectrum Instruments, Melytec, Promenergolab, OSTEC, OPTEC, INTERTECH Corporation, SITEC, Conetech, and IMC. Special thanks to Alexander Lukanin, who sponsored the awards for the best oral and poster presentations of young scientists.

You can download the best conference photos here (Google photos) or here (zip-file).
Abstract book is available in the section "Abstracts".

I hope that you enjoyed your staying in Ekaterinburg!

I invite you to the next conference SPM-2018 in Ekaterinburg on August 26-29, 2018!

Chairman of SPM-2017 and SPM-2018
Prof. Vladimir Ya. Shur



International conference
Scanning Probe Microscopy 2017 
August 28 – 30, 2017

Youth conference
Application of probe microscopy in research and development
August 27 – 30, 2017 

Ural Federal University, Ekaterinburg

Conference scope:

The conference will cover a wide range of topics related to modern state-of-the-art and future development of various Scanning Probe Microscopy techniques in different fields of science. The Youth Conference will include invited lectures of the leading scientists in the field and practical training on the equipment of Ural Center for Shared Use “Modern Nanotechnology” UrFU. The contest for the best presentation of the young scientists will be held. The conference will be the first in a row of annual conferences held in different cities of Russia.

Conference topics:

1. SPM in materials science 2. New methods of SPM
3. SPM in biology and medicine 4. SPM analytical methods
5. Probe lithography 6. In situ SPM abilities
7. SPM data processing 8. Piezoresponse force microscopy
9. Ferroics 10. Life science


Program committee:

Prof. A.A. Bukharaev Kazan, Russia Prof. I.V. Yaminsky Moscow, Russia
Prof. V.A. Bykov Zelenograd, Russia Dr. A.P. Volodin Leuven, Belgium
Prof. A.V. Latyshev Novosibirsk, Russia Prof. A.L. Gruverman Lincoln, USA
Prof. V.L. Mironov Nizhny Novgorod, Russia Prof. O.V. Kolosov Lancaster, UK
Prof. G.M. Mikhailov Chernogolovka, Russia Prof. A.L. Kholkin Aveiro, Portugal
Prof. A.A. Saranin Vladivostok, Russia Prof. S.A. Chizhik Minsk, Belarus
Prof. V.Ya. Shur Ekaterinburg, Russia Dr. V.V. Shvartsman Essen, Germany


Conference co-chairs:    Prof. Vladimir Shur and Prof. Victor Mironov

Official languages:     Russian and English

General sponsor:     holding NT-MDT Spectrum Instruments

Important dates:
Start of online registration:        March 01, 2017
Abstract submission deadline:     April 15, 2017

phone/fax: (343) 261 74 36