Invited speakers

List of invited speakers, who confirmed their participation:

Alexander Ankudinov (Ioffe Institute, Russia), Correction of contact stiffness values for AFM measurements on inclined samples

Victor Bykov (NT-MDT SI, Russia), The metrological power of new SPM and SPM with combination with spectroscopy and microcapillar current options for investigations and control including piesorespons materials

Neus Domingo (University of Barcelona, Spain)

Alexander Golubok (Institute for analitical instrumentation RAS, Russia), The specifics of the functioning of a scanning ion conductance microscope

Alexei Gruverman (University of Nebraska, USA)

Florian Hausen (FZ Julich, Germany), Spatially-resolved ionic conductivity in Solid State Electrolytes studied by Electrochemical Strain Microscopy

Yachin Ivry (TECHNION, Israel)

Andrei Kholkin (University of Aveiro, Portugal)

Yunseok Kim (SKKU, Korea)

Victor Mironov (IPM RAS, Russia), Magnetic resonance force spectroscopy of ferromagnetic nanostructures

Vladimir Shur (Ural Federal University, Russia)

Vladimir Shvartsman (University Duisburg-Essen, Germany)

Patrycia Paruch (University of Geneva, Switzerland)

Roger Proksch (Asylum Research, USA)

Bosiljka Tadic (Jozef Stefan Institute, Slovenia), The dynamics of domain walls in spin networks of complex morphology

Igor Yaminsky (Moscow State University, Russia), 3D precise manipulation in probe microscopy, bioprinting, biosensing and related techniques