Samples:
Highest sensitivity, broad spectra of local electrical measurements
Manufacturer: Asylum Research, USA
Year: 2013
Location: room 126
| Main features: | |
| Sizes of samples: | up to 100х100х15 mm3 |
| ХY resolution: | up to 10 nm |
| Z resolution: | up to 0.04 nm |
| Application of voltage: | up to 200 V |
| Local properties, which can be measured: | |
| micro-и nano-relief of the surface: | |
| range of heights: | up to 0.04 nm |
| Conductivity and spreading resistance: | |
| registered current: | above 1 nA |
| Work function of electrons | |
| Spatial distribution of surface potential | |
| Electromechanical properties | |
| Spatial distribution of magnetic properties |