Samples:
Measurements in vacuum and controlled atmosphere.
Manufacturer: NT-MDT, Russia
Year: 2006
Location: 109
| Main features: | |
| Measurements in gas media under controlled pressure | |
| Piezo-response force microscopy | |
| Contact scanning capacitance microscopy | |
| Atomic-force acoustic microscopy | |
| Measurements in liquid | |
| Voltage application: | up to 200 V |
| Sample heating: | up to 300 °С |