Wyko NT 1100


3D surface metrology: noncontact fast measurements of surface topography from nanometer scale roughness through millimeter scale steps.


Manufacturer: Veeco, USA
Year: 2006
Location: 229
Measurement techniques:  
vertical scanning interferometry  
    Z-range:  3 nm — 1 mm
phase-shifting interferometry  
    Z-range:  0.1 nm — 160 nm
Main features:  
Magnifications:  2.5x—100x
Lateral spatial sampling:  80 nm — 8 µm
Field of view:  50 µm — 5 mm
Auto stitching:  up to 100 mm
Организация*: Контактное лицо*: Email*: Телефон*: Заявка на измерение*: Объект исследования*: Ваше сообщение: