NTEGRA Spectra

Samples: 

Integration of scanning probe microscopy with confocal microscopy and Raman spectroscopy.

 

Manufacturer:  NT-MDT, Russia
Year:  2007
Location:  109

Additional capabilities:  
Spectroscopy and optical microscopy  
    effect of giant Raman scattering amplification  
    in-plane resolution:  up to 50 nm
Scanning laser confocal microscopy  
    including bulk scanning  
Confocal fluorescence microscopy and spectroscopy  
    including bulk scanning  
Scanning near-field optical microscopy  
Imaging of the same sample area  
    with atomic-force and optical methods  
Operations with transparent and opaque samples