X-ray diffraction analysis of polycrystalline materials.
Manufacturer: Shimadzu, Japan
Year: 2014
Location: 102в
| Cu-Kα-radiation, long fine focus (LFF): | 0.4×12 mm |
| Vertical θ -2θ goniometer radius: | 200—275 mm |
| Minimum step size: | 0.0001° (θ) |
| 0.0002° (2θ) | |
| Angle reproducibility: | +/–0.0002° |
| Scanning range: | -12 — +164° (2θ) |
| Auto 5 position sample changer (ASC 1001) | |
| In-plane rotation of the sample (1-60 rpm) | |
| in combination with oscillation around | |
| the goniometer sample axis (θ) | |
| High-temperature attachment HTK 1200N (Anton Paar) | |
| XRD diffraction in air and non-aggressive gas mixtures | |
| at temperature range: | 25—1200 °C |