Scanning electron microscope for wide range of life science samples.
Manufacturer: Carl Zeiss NTS, Germany
Year: 2014
Location: 113
Year: 2014
Location: 113
| Specifications: | |
| Electron gun: | thermionic emission (W, LaB6) |
| Resolution: | 3 nm @ 30 kV, 20 nm @ 1kV |
| Accelerating voltage: | 0.1—30 kV |
| Pressure Range: | 10—3000 Pa |
| Detectors | |
| Everhart-Thornley Secondary Electron Detector | |
| Variable Pressure Secondary Electron Detector | |
| Extended Pressure Secondary Electron Detector | |
| Backscattered Electron Detector (4QBSD) | |
| Energy Dispersive Spectrometer (EDS) | |
| Scanning transmission electron microscopy detector | |
| Environmental Electron Microscopy | |
| Peltier cooling stage | |
| Sample preparation system (Quorum Tech, UK) | |
| Ultramicrotome: | section thickness 5 nm — 15 µm |
| Rotary-pumped combined sputter coater and SEM carbon coater Q150RES | |
| Critical Point Dryer K850 | |
| CryoSEM preparation system PP3010T | |