Measurements of magnetic moments of bulk and thin film samples
Measurements of absorbance and reflectance at specific wavelengths or over a range for absolute or relative comparisons of solid and liquid samples
Measurement and analysis of ferroelectric, piezoelectric, pyroelectric and dielectric properties in thin films and bulk materials
Highest sensitivity, broad spectra of local electrical measurements
Sputtering of multilayer and composite metal, dielectric and magnetic films
Low pressure plasma system for plasma cleaning, activation, etching and coating
Deposition of metal and dielectric thin films by electron-beam evaporation and DC/RF magnetron sputtering
Continuous wave detection Electron Spin Resonance (EPR) and Electron-Nuclear-Double Resonance (ENDOR) at frequencies up to 100 Mhz
Scanning electron microscope for wide range of life science samples
Study of morphology, chemical and structural material properties with nanoscale resolution
Clean room environment (class 100)
Cryogen-free investigation of various physical properties in wide temperature range and high magnetic fields
Measurement of the samples’ mass changes with respect to the temperature and gas atmosphere
Production of ultrapure (type I) deionized water with recirculation line
Wide range of fast and accurate non-contact 2-axis measurements
Precision lapping and polishing of crystalline wafers
Direct measurements of adiabatic temperature changes initiated by changes of magnetic field and heat capacity at different magnetic fields
Measurement of magnetic hysteresis characteristics of magnetic materials
Visualization of magnetic domains and automatic measurement of magnetooptical hysteresis loops
Measurement of size distribution, Zeta-potential and molecular weight of nanoand submicro-particles and molecules in colloid solutions
Measuring of hardness and elastic module by nanoindentation and surface topography on nanometer scale
Measurement of linear thermal dilatation of solid and liquid powders, pastes and ceramic fibers
Qualitative and quantitative analysis of gaseous decomposition products of inorganic matters
Simultaneous Thermo Analysis (TG-DSC or TG-DTA) in wide temperature range
Measurements in vacuum and controlled atmosphere
Integration of scanning probe microscopy with confocal microscopy and Raman spectroscopy
Wide range of optical microscopy investigations with automatic image analysis
Automatic multi-step spin wafer cleaning, resist development, and resist stripping
Plasma reactive ion etching of metals, Si and Si compounds, and dielectrics
Thermogravimetric analyser
Measurement of magnetic properties with high sensitivity in wide temperature range
Determination of rheological parameters: viscosity, shear stress, and shear rate
Investigations in the field of material science, microelectronics, products composition control, legal expertise
Resist spin coating and thermal backing
Carrying out mechanical tests for stretching and compression of various materials
X-ray diffraction analysis of polycrystalline materials
Alignment of photomask with wafer and resist exposition for contact lithography
Quantitative and qualitative elemental analysis with simultaneous detection of up to 40 elements
Qualitative elemental analysis of different samples for inorganic components
High-quality surface area and porosimetry measurements on solid materials by using the technique of gas adsorption and desorption
Laser marking, engraving, and cutting of wide range of materials
Quadrupole (Q) and time-of-flight (Tof) high resolution mass spectrometer
Nondestructive chemical analysis and surface relief mapping
3D surface metrology: noncontact fast measurements of surface topography from nanometer scale roughness through millimeter scale steps
![Кривая намагничивания и петля гистерезиса монокристалла Nb измеренные в направлении [100] при температуре 2К](https://nanocenter.urfu.ru/sites/default/files/styles/sample_image/public/%D0%9A%D1%80%D0%B8%D0%B2%D0%B0%D1%8F%20%D0%BD%D0%B0%D0%BC%D0%B0%D0%B3%D0%BD%D0%B8%D1%87%D0%B8%D0%B2%D0%B0%D0%BD%D0%B8%D1%8F%20%D0%B8%20%D0%BF%D0%B5%D1%82%D0%BB%D1%8F%20%D0%B3%D0%B8%D1%81%D1%82%D0%B5%D1%80%D0%B5%D0%B7%D0%B8%D1%81%D0%B0%20%D0%BC%D0%BE%D0%BD%D0%BE%D0%BA%D1%80%D0%B8%D1%81%D1%82%D0%B0%D0%BB%D0%BB%D0%B0%20Nb%20%D0%B8%D0%B7%D0%BC%D0%B5%D1%80%D0%B5%D0%BD%D0%BD%D1%8B%D0%B5%20%D0%B2%20%20%D0%BD%D0%B0%D0%BF%D1%80%D0%B0%D0%B2%D0%BB%D0%B5%D0%BD%D0%B8%D0%B8%20%5B100%5D%20%D0%BF%D1%80%D0%B8%20%D1%82%D0%B5%D0%BC%D0%BF%D0%B5%D1%80%D0%B0%D1%82%D1%83%D1%80%D0%B5%202%D0%9A.jpg?itok=3xvsTG0O)
